Nanoscale Condensed Matter - Structures and Thin Films

Led by: Cristian Mihail TEODORESCU
Fields: Mater. Sci. Chemistry & Synthesis
Univ. Sci. & Instrum.
Institution: National Institute of Material Physics (INFIM)
Scientists/Total: 17/23
Keywords:  -

Surface and interface science in ultrahigh vacuum: preparation, growth and in situ characterization of single crystal surfaces and epitaxial films. X-ray and UV photoelectron spectroscopies. X-ray diffraction: theory, development of analysis methods, experiments. Crystal growth and characterization. Preparation of thin films with biomedical applications.


In the MBE (Molecular Beam Epitaxy) chamber:
- sample heating up to 1200 C; cooling down to 77 K;
- evaporation from a 4-target e-beam evaporator;
- evaporation from a high temperature Knudsen cell (2000 C);
- controlled gas adsorption and desorption;
- monitor of thicknesses using a quartz microbalance.
In the STM (Scanning Tunneling Microscope) chamber:
- sample preparation stage (heating, ion sputtering);
- tip preparation (ion sputtering);
- variable temperature (77 - 453 K) scanning tunneling microscopy (STM);
- scanning tunneling spectroscopy (STS);
In The Spin- and Angle-resolved Photoelectron Spectroscopy (SARPES) chamber:
- conventional X-ray photoelectron spectroscopy using a dual (Al/Mg Kα) anode;
- high resolution XPS using a monochromatized dual (Al Kα /Ag Lα) source;
- ultraviolet photoelectron spectroscopy (UPS);
- angle-resolved XPS: x-ray photoelectron diffraction (XPD);
- angle-resolved UPS (ARUPS): band structure, Fermi surface, etc.;
- spin-resolved UPS: spin-polarized density of states;
- angle- and spin-resolved UPS: spin-polarized band structure;
- programable ion sputtering: depth profiling;
- flood gun for sample neutralization;
- electron gun for AES;
- medium energy ion scattering spectroscopy (MEIS).



Str. Atomiştilor nr. 105 bis, 077125
Măgurele, jud. Ilfov, România
Tel: +40 213 690170 ext. 128, 228
Fax: +40 213 690177




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