Center for Nanotechnologies (CNT- IMT)

Led by: Dan DASCĂLU
Fields: Mater. Sci. Chemistry & Synthesis
Elec. Electron. Sys. & Telecom. Eng.
Products and process engineering
Institution: National Institute for Research and Development in Microtechnologies (IMT)
Scientists/Total: 20/24
Keywords:  nanomaterials, nanostructures, nanobiotechnology, nano-scale structuring and characterization, molecular nanotechnology

The National Institute for Microtechnologies is active in the micro- and nanotechnologies domain. The object of activity includes also “nanotechnology”, even if this term is not comprised in the institute name.
The current dominant trends at worldwide level are the following:
a) Reducing the dimensions and evolution from “micro” towards “nano”
b) Convergence of “micro-nano-bio-info” technologies
c) Applying of micro- and nanotechnologies in the conventional industries
d) Set up and develop high-level research and development infrastructures (technological and characterization facilities) which allow direct or indirect access of industry members and young researchers (usually PhDs) to equipments and know-how


Field Emission and Scanning Electron Microscope (FEG-SEM) - Nova NanoSEM 630 (FEI Company, USA)
Scanning Electron Microscope - Vega II LMU @ Pattern Generator - PG Elphy Plus (TESCAN s.r.o , Czech Republic @ Raith, Germany)
Scanning Probe Microscope - NTEGRA Aura (NT-MDT Co., Russia)
Scanning Near-field Optical Microscope - Witec alpha 300S (Witec, Germany)
Scanning Electrochemical Microscope - ElProScan (HEKA, Germany)
Nanomechanical Characterization equipment - Nano Indenter G200 (Agilent Technologies, USA)
X-ray Diffraction System (triple axis rotating anode) - SmartLab - 9kW rotating anode, in-plane arm (Rigaku Corporation, Japan)
High Resolution Raman Spectrometer - LabRAM HR 800 (HORIBA Jobin Yvon, Japan)
Spectroscopic ellipsometer - SE 800 XUV (SENTECH Instruments, Germany)
Combined Time Resolved and Steady State Fluorescence Spectrometer - FLS920P (Edinburgh Instruments, UK) UV-VIS-NIR Spectrophotometer - SPECORD M42 (Zeiss, Germany)
Fourier–Transform Infrared Spectrometer - Tensor 27 (Bruker Optics, Germany)
UV-Vis-NIR Thermo-Electric Cooled Fiber Optic Spectrometer - AvaSpec-2048 TEC (Avantes, The Netherlands)
NIR Spectrometer - AvaSpec NIR256-2.2 (Avantes, The Netherlands)
White Light Interferometer


We are summarizing below CNT- IMT's main areas of expertise:
- fabrication of functional nanomaterials / nanostructures, study, control and tuning of their properties towards applications, together with appropriate surface functionalization methods;
- advanced characterization techniques for nanomaterials and thin films
- design and fabrication of new devices on silicon, polymers or hybrid multilevel system
- nanoscale characterization of surfaces and interfaces by Scanning Probe Microscopy. Nanoscale patterning by Gaussian beam Electron Beam Lithography (EBL).


Str. Erou Iancu nr. 32 B, 077190
Municipiul București, România
Tel: +40 214 908212
Fax: +40 214 908238




0 Patents or Software


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