Nano-Scale Structuring and Characterization

Led by: Miron Adrian DINESCU
Fields: Mater. Sci. Chemistry & Synthesis
Elec. Electron. Sys. & Telecom. Eng.
Products and process engineering
Institution: National Institute for Research and Development in Microtechnologies (IMT)
Scientists/Total: 4/4
Keywords:  -

Micro and nanoscale characterization through Scanning Probe Microscopy, Nanoscale patterning through Electron Beam Lithography. Nano-indentation. Scanning Electron Microscopy, Nano-indentation.


- Scanning Probe Microscope NTEGRA Aura (NT- MDT Co.)
- Nano Indenter G200 (Agilent Technologies, Inc.)
- Field Emission Gun Scanning Electron Microscope (FEG-SEM) –FEI Nova NanoSEM 630 (FEI)
- Tungsten Heated Filament Scanning Electron Microscope-Tescan VEGA LMU II and Energy Dispersive X Ray Spectrometer with Si(Li) detector – EDAX
- Electron Beam Lithography and nanoengineering workstation – Raith e_Line



Str. Erou Iancu Nicolae nr. 126A, 077190
Municipiul București, România
Tel: +40-21 2690778 ext. 32
Fax: +40 21 2690772 / 76




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